Scanning Nonlinear Dielectric Microscopy

This PDF book is become immediate popular in Technology & Engineering genre. Scanning Nonlinear Dielectric Microscopy is written by famous author Yasuo Cho and Ready to Download in ePUB, PDF or Kindle formats. Released by Woodhead Publishing in 2020-05-20. Click Download Book button to get book file and read directly from your devices. Here is a quick description and cover image of Scanning Nonlinear Dielectric Microscopy book.

Scanning Nonlinear Dielectric Microscopy
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Publisher : Woodhead Publishing
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ISBN : 9780081028032
Pages : 256 pages
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Scanning Nonlinear Dielectric Microscopy by Yasuo Cho Book PDF Summary

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique


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Scanning Nonlinear Dielectric Microscopy PDF book is popular Technology & Engineering book written by Yasuo Cho. The book was released by Woodhead Publishing in 20 May 2020 with total hardcover pages 256. Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by

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